A Bayes approach to step-stress accelerated life testing

نویسندگان

  • J. René van Dorp
  • Thomas A. Mazzuchi
  • G. E. Fornell
  • L. R. Pollock
چکیده

Conclusions This article develops a Bayes model for step-stress accelerated life testing. The failure times at each stress level are exponentially distributed, but the specification of strict adherence to a time transformation function is not required. Rather, prior information is used to define indirectly a multivariate prior distribution for the failure rates at the various stress levels. Our prior distribution preserves the natural ordering of the failure rates in both the prior and posterior estimates. Methods are developed for Bayes point estimates as well as for making probability statements for usestress life parameters. The approach is illustrated with an example.

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عنوان ژورنال:
  • IEEE Trans. Reliability

دوره 45  شماره 

صفحات  -

تاریخ انتشار 1996